In this paper, an analysis of various factors affecting machined surface texture is presented. The investigation was focused on ball end mill inclination against the work piece (defined by surface inclination angle a. Surface roughness was investigated in a 3D array, and measurements were conducted parallel to the feed motion direction. The analysis of machined surface irregularities as a function of frequency (wavelength A), on the basis of the Power Density Spectrum - PDS was also carried out. This kind of analysis is aimed at valuation of primary factors influencing surface roughness generation as well as its randomness. Subsequently, a surface roughness model including cutter displacements was developed. It was found that plain cutting with ball end mill (surface inclination angle a= 0°) is unfavorable from the point of view of surface roughness, because in cutter’s axis the cutting speed vc ~ 0 m/min. This means that a cutting process does not occur, whereas on the machined surface some characteristics marks can be found. These marks do not appear in case of a* 0°, because the cutting speed vc * 0 on the fill I length of the active cutting edge and as a result, the machined surface texture is more homogenous. Surface roughness parameters determined on the basis of the model including cutter displacements are closer to experimental data for cases with inclination angles a* 0°, in comparison with those determined for plain cutting (a= 0°). It is probably caused by higher contribution in surface irregularities generation of plastic and elastic deformations cumulated near the cutter’s free end than kinematic and geometric parameters, as well as cutter displacements.
The paper presents the results of investigations concerning the application of zinc oxide - a wideband gap semiconductor in optical planar waveguide structures. ZnO is a promising semiconducting material thanks to its attractive optical properties. The investigations were focused on the determination of the technology of depositions and the annealing of ZnO layers concerning their optical properties. Special attention was paid to the determination of characteristics of the refractive index of ZnO layers and their coefficients of spectral transmission within the UV-VIS-NIR range. Besides that, also the mode characteristics and the attenuation coefficients of light in the obtained waveguide structures have been investigated. In the case of planar waveguides, in which the ZnO layers have not been annealed after their deposition, the values of the attenuation coefficient of light modes amount to a~ 30 dB/cm. The ZnO layers deposited on the heated substrate and annealed by rapid thermal annealing in an N2 and O2 atmosphere, are characterized by much lower values of the attenuation coefficients: a~ 3 dB/cm (TE0 and TM0 modes). The ZnO optical waveguides obtained according to our technology are characterized by the lowest values of the attenuation coefficients a encountered in world literature concerning the problem of optical waveguides based on ZnO. Studies have shown that ZnO layers elaborated by us can be used in integrated optic systems, waveguides, optical modulators and light sources.